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発光デバイスのプロトン照射効果測定
https://doi.org/10.57375/00000459
https://doi.org/10.57375/0000045900e46f09-4827-4e32-871d-f08b2d94dd7e
名前 / ファイル | ライセンス | アクション |
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KJ00004766982.pdf (550.4 kB)
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Item type | 紀要論文 / Departmental Bulletin Paper(1) | |||||
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公開日 | 2009-04-04 | |||||
タイトル | ||||||
タイトル | 発光デバイスのプロトン照射効果測定 | |||||
タイトル | ||||||
言語 | en | |||||
タイトル | Measurements of Proton Irradiation Effects in Light Emitting Devices | |||||
言語 | ||||||
言語 | jpn | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | departmental bulletin paper | |||||
ID登録 | ||||||
ID登録 | 10.57375/00000459 | |||||
ID登録タイプ | JaLC | |||||
著者 |
權田, 俊一
× 權田, 俊一× 津々美, 裕之× 伊藤, 慶文× 石神, 龍哉× 久米, 恭× 菅, 文博× Gonda, Shun-ichi× Tsutsumi, Hiroyuki× Ito, Yoshifumi× Ishigami, Ryoya× Kume, Kyo× Kan, Hirofumi |
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抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | A measurement system for proton radiation effects in light emitting devices such as light emitting diodes and semiconductor lasers are described. 10-MeV and 200-MeV proton beams in the Wakasawan Energy Research Center are utilized. Current vs. voltage characteristics, current vs. light output characteristics and spectra can be measured using an integration sphere, a Si photodiode, a data logger and a spectrometer. In the case of 200-MeV irradiation, remote measurement is conducted. | |||||
書誌情報 |
福井工業大学研究紀要. 第一部 号 37, p. 319-326, 発行日 2007-05-31 |
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出版者 | ||||||
出版者 | 福井工業大学 | |||||
ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 2868571 | |||||
書誌レコードID | ||||||
識別子タイプ | NCID | |||||
関連識別子 | TF00008918 | |||||
著者版フラグ | ||||||
出版タイプ | VoR | |||||
出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 |