{"created":"2023-06-20T13:42:52.541487+00:00","id":465,"links":{},"metadata":{"_buckets":{"deposit":"205fe573-864c-4068-b91b-baefd6ba7f55"},"_deposit":{"created_by":2,"id":"465","owners":[2],"pid":{"revision_id":0,"type":"depid","value":"465"},"status":"published"},"_oai":{"id":"oai:fut.repo.nii.ac.jp:00000465","sets":["1"]},"author_link":["10062","10060","10064","10055","10063","10065","10056","10061","10059","10057","10058","10054"],"item_10002_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2007-05-31","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"37","bibliographicPageEnd":"326","bibliographicPageStart":"319","bibliographic_titles":[{"bibliographic_title":"福井工業大学研究紀要. 第一部"}]}]},"item_10002_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"A measurement system for proton radiation effects in light emitting devices such as light emitting diodes and semiconductor lasers are described. 10-MeV and 200-MeV proton beams in the Wakasawan Energy Research Center are utilized. Current vs. voltage characteristics, current vs. light output characteristics and spectra can be measured using an integration sphere, a Si photodiode, a data logger and a spectrometer. In the case of 200-MeV irradiation, remote measurement is conducted.","subitem_description_type":"Abstract"}]},"item_10002_identifier_registration":{"attribute_name":"ID登録","attribute_value_mlt":[{"subitem_identifier_reg_text":"10.57375/00000459","subitem_identifier_reg_type":"JaLC"}]},"item_10002_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"福井工業大学"}]},"item_10002_relation_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"TF00008918","subitem_relation_type_select":"NCID"}}]},"item_10002_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"2868571","subitem_source_identifier_type":"ISSN"}]},"item_10002_version_type_20":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"權田, 俊一"}],"nameIdentifiers":[{"nameIdentifier":"10054","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"津々美, 裕之"}],"nameIdentifiers":[{"nameIdentifier":"10055","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"伊藤, 慶文"}],"nameIdentifiers":[{"nameIdentifier":"10056","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"石神, 龍哉"}],"nameIdentifiers":[{"nameIdentifier":"10057","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"久米, 恭"}],"nameIdentifiers":[{"nameIdentifier":"10058","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"菅, 文博"}],"nameIdentifiers":[{"nameIdentifier":"10059","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Gonda, Shun-ichi","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"10060","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Tsutsumi, Hiroyuki","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"10061","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Ito, Yoshifumi","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"10062","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Ishigami, Ryoya","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"10063","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Kume, Kyo","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"10064","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Kan, Hirofumi","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"10065","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2023-04-12"}],"displaytype":"detail","filename":"KJ00004766982.pdf","filesize":[{"value":"550.4 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"KJ00004766982.pdf","url":"https://fut.repo.nii.ac.jp/record/465/files/KJ00004766982.pdf"},"version_id":"af3d0127-3750-4557-9a4c-120d0912716a"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"発光デバイスのプロトン照射効果測定","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"発光デバイスのプロトン照射効果測定"},{"subitem_title":"Measurements of Proton Irradiation Effects in Light Emitting Devices","subitem_title_language":"en"}]},"item_type_id":"10002","owner":"2","path":["1"],"pubdate":{"attribute_name":"公開日","attribute_value":"2009-04-04"},"publish_date":"2009-04-04","publish_status":"0","recid":"465","relation_version_is_last":true,"title":["発光デバイスのプロトン照射効果測定"],"weko_creator_id":"2","weko_shared_id":-1},"updated":"2023-06-20T14:31:55.766420+00:00"}