{"created":"2023-06-20T13:43:14.069747+00:00","id":931,"links":{},"metadata":{"_buckets":{"deposit":"e000496e-df95-451b-be69-f70cfb1fddac"},"_deposit":{"created_by":2,"id":"931","owners":[2],"pid":{"revision_id":0,"type":"depid","value":"931"},"status":"published"},"_oai":{"id":"oai:fut.repo.nii.ac.jp:00000931","sets":["1"]},"author_link":["11661","11662","11664","11665","11663","11660"],"item_10002_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2000-03-20","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"30","bibliographicPageEnd":"69","bibliographicPageStart":"63","bibliographic_titles":[{"bibliographic_title":"福井工業大学研究紀要. 第二部"}]}]},"item_10002_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Scattered laser light from a rough surface forms speckle patterns due to random interferences of the light from randomly oriented surface elements. Electronic speckle pattern interferometry (ESPI) is a measurement tool to analyze deformations or displacements without giving any disturbances to the objects. This report gives a brief review of ESPI and some experimental data, processing of the patterns, and their analises regarding the speckle patterns taken by an electonic CCD camera.","subitem_description_type":"Abstract"}]},"item_10002_identifier_registration":{"attribute_name":"ID登録","attribute_value_mlt":[{"subitem_identifier_reg_text":"10.57375/00000925","subitem_identifier_reg_type":"JaLC"}]},"item_10002_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"福井工業大学"}]},"item_10002_relation_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"TF00009384","subitem_relation_type_select":"NCID"}}]},"item_10002_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"2868571","subitem_source_identifier_type":"ISSN"}]},"item_10002_version_type_20":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"松本, 和也"}],"nameIdentifiers":[{"nameIdentifier":"11660","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"佐々木, 康雄"}],"nameIdentifiers":[{"nameIdentifier":"11661","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"南條, 基"}],"nameIdentifiers":[{"nameIdentifier":"11662","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Matsumoto, Kazuya","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"11663","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Sasaki, Yasuo","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"11664","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Nanjo, Motoi","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"11665","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2023-04-12"}],"displaytype":"detail","filename":"KJ00000201947.pdf","filesize":[{"value":"468.9 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"KJ00000201947.pdf","url":"https://fut.repo.nii.ac.jp/record/931/files/KJ00000201947.pdf"},"version_id":"ff5d6306-0701-48ec-9aaf-a717ec6ab3d7"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"電子カメラによるスペックル相関画像計測","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"電子カメラによるスペックル相関画像計測"},{"subitem_title":"Speckle Correlation Interferometry by Electronic Camera","subitem_title_language":"en"}]},"item_type_id":"10002","owner":"2","path":["1"],"pubdate":{"attribute_name":"公開日","attribute_value":"2009-04-04"},"publish_date":"2009-04-04","publish_status":"0","recid":"931","relation_version_is_last":true,"title":["電子カメラによるスペックル相関画像計測"],"weko_creator_id":"2","weko_shared_id":-1},"updated":"2023-06-20T14:22:20.834952+00:00"}