{"created":"2023-06-20T13:42:33.563171+00:00","id":78,"links":{},"metadata":{"_buckets":{"deposit":"9baed0d9-9c92-4827-8053-933a6cffa084"},"_deposit":{"created_by":2,"id":"78","owners":[2],"pid":{"revision_id":0,"type":"depid","value":"78"},"status":"published"},"_oai":{"id":"oai:fut.repo.nii.ac.jp:00000078","sets":["1"]},"author_link":["8646","8644","8645","8649","8648","8647"],"item_10002_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2012-08-02","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"42","bibliographicPageEnd":"486","bibliographicPageStart":"481","bibliographic_titles":[{"bibliographic_title":"福井工業大学研究紀要"}]}]},"item_10002_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"In 2012, there are 50 commercial nuclear power plants in Japan. There are 20 nuclear power plants which are working for 30 years or more. It is very important to measure the aged deterioration of the cable used in those nuclear power plants. Generally, degradation of a cable was measured by the tensile test. It was difficult to measure an electrical property quickly and nondestructively. We developed the nondestructive measurement technology of cable degradation which used microwave technology.","subitem_description_type":"Abstract"}]},"item_10002_identifier_registration":{"attribute_name":"ID登録","attribute_value_mlt":[{"subitem_identifier_reg_text":"10.57375/00000072","subitem_identifier_reg_type":"JaLC"}]},"item_10002_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"福井工業大学"}]},"item_10002_relation_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"TF00008531","subitem_relation_type_select":"NCID"}}]},"item_10002_version_type_20":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"砂川, 武義"}],"nameIdentifiers":[{"nameIdentifier":"8644","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"佐伯, 昭紀"}],"nameIdentifiers":[{"nameIdentifier":"8645","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"関, 修平"}],"nameIdentifiers":[{"nameIdentifier":"8646","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Sunagawa, Takeyoshi","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"8647","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Saeki, Akinori","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"8648","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Seki, shu","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"8649","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2023-04-12"}],"displaytype":"detail","filename":"kiyou4256.pdf","filesize":[{"value":"4.4 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"kiyou4256.pdf","url":"https://fut.repo.nii.ac.jp/record/78/files/kiyou4256.pdf"},"version_id":"2845463b-bb84-46c4-9815-c9a7fb913b25"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"原子力,高経年化","subitem_subject_scheme":"Other"},{"subitem_subject":"ケーブル劣化","subitem_subject_scheme":"Other"},{"subitem_subject":"非破壊診断","subitem_subject_scheme":"Other"},{"subitem_subject":"マイクロ波誘電吸収法","subitem_subject_scheme":"Other"},{"subitem_subject":"ふげん発電所","subitem_subject_scheme":"Other"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"マイクロ波検出技術を用いた高分子材料への熱・放射線照射による経年劣化測定技術に関する研究(III)","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"マイクロ波検出技術を用いた高分子材料への熱・放射線照射による経年劣化測定技術に関する研究(III)"},{"subitem_title":"Non-contact Quantitative Microwave Detection of Radiation Induced Degradation of Polymers (III)","subitem_title_language":"en"}]},"item_type_id":"10002","owner":"2","path":["1"],"pubdate":{"attribute_name":"公開日","attribute_value":"2012-08-02"},"publish_date":"2012-08-02","publish_status":"0","recid":"78","relation_version_is_last":true,"title":["マイクロ波検出技術を用いた高分子材料への熱・放射線照射による経年劣化測定技術に関する研究(III)"],"weko_creator_id":"2","weko_shared_id":-1},"updated":"2023-06-20T14:40:05.691566+00:00"}