{"created":"2023-06-20T13:43:05.231792+00:00","id":739,"links":{},"metadata":{"_buckets":{"deposit":"0e1bac48-1477-48a1-808e-80a7d7f20fff"},"_deposit":{"created_by":2,"id":"739","owners":[2],"pid":{"revision_id":0,"type":"depid","value":"739"},"status":"published"},"_oai":{"id":"oai:fut.repo.nii.ac.jp:00000739","sets":["1"]},"author_link":["11032","11033"],"item_10002_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1995-03-20","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"25","bibliographicPageEnd":"17-20","bibliographicPageStart":"17-20","bibliographic_titles":[{"bibliographic_title":"福井工業大学研究紀要. 第一部"}]}]},"item_10002_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"The Influence of thickness of obstacles on the diffraction Is studied experimentally. The effects of constant thickness of an obstacle are found in the fringe spacing and Intensity of the interference pattern produced by the secondary waves originating from the sides of the sample. It Is found that thickness of samples can be measured using the interference pattern appearing in the shadow region of ones without contacting.","subitem_description_type":"Abstract"}]},"item_10002_identifier_registration":{"attribute_name":"ID登録","attribute_value_mlt":[{"subitem_identifier_reg_text":"10.57375/00000733","subitem_identifier_reg_type":"JaLC"}]},"item_10002_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"福井工業大学"}]},"item_10002_relation_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"TF00009192","subitem_relation_type_select":"NCID"}}]},"item_10002_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"2868571","subitem_source_identifier_type":"ISSN"}]},"item_10002_version_type_20":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"金井, 徳兼"}],"nameIdentifiers":[{"nameIdentifier":"11032","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"KANAI, Norikane","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"11033","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2023-04-12"}],"displaytype":"detail","filename":"KJ00000201696.pdf","filesize":[{"value":"167.6 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"KJ00000201696.pdf","url":"https://fut.repo.nii.ac.jp/record/739/files/KJ00000201696.pdf"},"version_id":"72a02bfd-6395-4fc9-8883-9b6cf5690775"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"回折現象をもちいた直方体の光軸方向厚みの計測について","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"回折現象をもちいた直方体の光軸方向厚みの計測について"},{"subitem_title":"Measurment of constant thickness of volumetric bodies using diffraction","subitem_title_language":"en"}]},"item_type_id":"10002","owner":"2","path":["1"],"pubdate":{"attribute_name":"公開日","attribute_value":"2009-04-10"},"publish_date":"2009-04-10","publish_status":"0","recid":"739","relation_version_is_last":true,"title":["回折現象をもちいた直方体の光軸方向厚みの計測について"],"weko_creator_id":"2","weko_shared_id":-1},"updated":"2023-06-20T14:26:18.177877+00:00"}