{"created":"2023-06-20T13:42:57.762236+00:00","id":576,"links":{},"metadata":{"_buckets":{"deposit":"4daba35d-124e-4e3b-83a9-d6c9d7ffcae6"},"_deposit":{"created_by":2,"id":"576","owners":[2],"pid":{"revision_id":0,"type":"depid","value":"576"},"status":"published"},"_oai":{"id":"oai:fut.repo.nii.ac.jp:00000576","sets":["1"]},"author_link":["10451","10452","10454","10457","10453","10456","10455","10458"],"item_10002_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2007-05-31","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"37","bibliographicPageEnd":"32","bibliographicPageStart":"25","bibliographic_titles":[{"bibliographic_title":"福井工業大学研究紀要. 第一部"}]}]},"item_10002_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Defects in several compound semiconducting single crystals are evaluated by using the light scattering tomography. The dislocations in ZnSe and ZnO single crystals are observed by decorating them with precipitate, which were generated by heat treatment. We obtain three dimensional views of linear and curved dislocations in ZnSe crystals. Linear dislocations are detected for the first time by several annealing. Micropipes along growth direction are also found by this method.","subitem_description_type":"Abstract"}]},"item_10002_identifier_registration":{"attribute_name":"ID登録","attribute_value_mlt":[{"subitem_identifier_reg_text":"10.57375/00000570","subitem_identifier_reg_type":"JaLC"}]},"item_10002_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"福井工業大学"}]},"item_10002_relation_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"TF00009029","subitem_relation_type_select":"NCID"}}]},"item_10002_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"2868571","subitem_source_identifier_type":"ISSN"}]},"item_10002_version_type_20":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"龍見, 雅美"}],"nameIdentifiers":[{"nameIdentifier":"10451","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"高村, 涼介"}],"nameIdentifiers":[{"nameIdentifier":"10452","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"高氏, 信吾"}],"nameIdentifiers":[{"nameIdentifier":"10453","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"高田, 慎一"}],"nameIdentifiers":[{"nameIdentifier":"10454","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Tatsumi, Masami","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"10455","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Takamura, Ryousuke","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"10456","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Takauji, Shingo","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"10457","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Takada, Shinichi","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"10458","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2023-04-12"}],"displaytype":"detail","filename":"KJ00004766940.pdf","filesize":[{"value":"2.6 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"KJ00004766940.pdf","url":"https://fut.repo.nii.ac.jp/record/576/files/KJ00004766940.pdf"},"version_id":"2068fa68-f5d6-404f-8a7a-25a4328aa488"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"光散乱トモグラフィによる単結晶の欠陥評価","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"光散乱トモグラフィによる単結晶の欠陥評価"},{"subitem_title":"EVALUATION OF DEFECTS IN SINGLE CRYSTAL BY THE LIGHT SCATTERING TOMOGRAPHY","subitem_title_language":"en"}]},"item_type_id":"10002","owner":"2","path":["1"],"pubdate":{"attribute_name":"公開日","attribute_value":"2009-04-04"},"publish_date":"2009-04-04","publish_status":"0","recid":"576","relation_version_is_last":true,"title":["光散乱トモグラフィによる単結晶の欠陥評価"],"weko_creator_id":"2","weko_shared_id":-1},"updated":"2023-06-20T14:29:36.911771+00:00"}