{"created":"2023-06-20T13:42:52.499606+00:00","id":464,"links":{},"metadata":{"_buckets":{"deposit":"a7f59fed-e487-4d6e-a206-14a51a174816"},"_deposit":{"created_by":2,"id":"464","owners":[2],"pid":{"revision_id":0,"type":"depid","value":"464"},"status":"published"},"_oai":{"id":"oai:fut.repo.nii.ac.jp:00000464","sets":["1"]},"author_link":["10052","10053"],"item_10002_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2008-05-31","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"38","bibliographicPageEnd":"384","bibliographicPageStart":"381","bibliographic_titles":[{"bibliographic_title":"福井工業大学研究紀要. 第一部"}]}]},"item_10002_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"パルスラジオリシス・マイクロ波加熱空洞法を用いて、気体温度を173～600Kの領域で変化させた条件下でCF_3Br,CF_3Iの電子付着速度定数の平均電子エネルギー依存の測定を行った。その結果を基にunfolding法により電子断面積へ変換した。断面積は全ての温度領域で<0.01eVに極大を示し、電子エネルギーの増大とともに減少する傾向を示した。また、約0.1eV以上の電子エネルギー領域では、気体温度の低下とともに各気体温度での断面積の差が減少した。これらの結果を基にハロゲン化合物の電子付着過程における振動励起分子の及ぼす影響を検討した。 / The microwave-cavity technique has been developed to enable variation of both the mean electron energy and the ambient temperature to study low-energy electron attachment to molecules. The rate constants as a function of the mean electron energy have been measured for electron attachment to CF_3Br and CF_3I at ambient temperatures between 173 and 600K. The electron attachment cross sections all show maximum at < 0.01 eV with no noticeable peak at hieher electron energies.","subitem_description_type":"Abstract"}]},"item_10002_identifier_registration":{"attribute_name":"ID登録","attribute_value_mlt":[{"subitem_identifier_reg_text":"10.57375/00000458","subitem_identifier_reg_type":"JaLC"}]},"item_10002_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"福井工業大学"}]},"item_10002_relation_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"TF00008917","subitem_relation_type_select":"NCID"}}]},"item_10002_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"2868571","subitem_source_identifier_type":"ISSN"}]},"item_10002_version_type_20":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"砂川, 武義"}],"nameIdentifiers":[{"nameIdentifier":"10052","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Sunagawa, Takeyoshi","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"10053","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2023-04-12"}],"displaytype":"detail","filename":"KJ00005074559.pdf","filesize":[{"value":"302.8 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"KJ00005074559.pdf","url":"https://fut.repo.nii.ac.jp/record/464/files/KJ00005074559.pdf"},"version_id":"8a14d946-1e94-49bb-a006-deedd47c9cb9"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"CF_3X(X=Br,I)の低エネルギー電子付着過程の研究","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"CF_3X(X=Br,I)の低エネルギー電子付着過程の研究"},{"subitem_title":"Low energy electron attachment to CF_3 X(X=Br,I)","subitem_title_language":"en"}]},"item_type_id":"10002","owner":"2","path":["1"],"pubdate":{"attribute_name":"公開日","attribute_value":"2009-03-23"},"publish_date":"2009-03-23","publish_status":"0","recid":"464","relation_version_is_last":true,"title":["CF_3X(X=Br,I)の低エネルギー電子付着過程の研究"],"weko_creator_id":"2","weko_shared_id":-1},"updated":"2023-06-20T14:31:57.412796+00:00"}