{"created":"2023-06-20T13:42:40.506727+00:00","id":229,"links":{},"metadata":{"_buckets":{"deposit":"9c5734f5-1b0d-4851-ac27-e440b5170cff"},"_deposit":{"created_by":2,"id":"229","owners":[2],"pid":{"revision_id":0,"type":"depid","value":"229"},"status":"published"},"_oai":{"id":"oai:fut.repo.nii.ac.jp:00000229","sets":["1"]},"author_link":["9237","9236"],"item_10002_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2004-03-20","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"34","bibliographicPageEnd":"68","bibliographicPageStart":"61","bibliographic_titles":[{"bibliographic_title":"福井工業大学研究紀要. 第一部"}]}]},"item_10002_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Recently, the position sensitive detector (PSD) has been popular as a detector of X-ray stress measurement. However, little information is available on the effect of specimen mis-setting to the stress error for X-ray stress measurement using PSD. Therefore, the authors have developed a model and a simulation method of X-ray stress measurement to study the effect of specimen mis-setting. In this paper, the simulation of X-ray stress measurement for the specimen masked by a vinyl tape except the X-ray exposure area is conducted and the stress error caused by specimen mis-setting is discussed. It was concluded that the masking has a tendency to increase the stress error.","subitem_description_type":"Abstract"}]},"item_10002_identifier_registration":{"attribute_name":"ID登録","attribute_value_mlt":[{"subitem_identifier_reg_text":"10.57375/00000223","subitem_identifier_reg_type":"JaLC"}]},"item_10002_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"福井工業大学"}]},"item_10002_relation_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"TF00008682","subitem_relation_type_select":"NCID"}}]},"item_10002_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"2868571","subitem_source_identifier_type":"ISSN"}]},"item_10002_version_type_20":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"後藤, 徹"}],"nameIdentifiers":[{"nameIdentifier":"9236","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"GOTO, Toru","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"9237","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2023-04-12"}],"displaytype":"detail","filename":"KJ00004259111.pdf","filesize":[{"value":"493.3 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"KJ00004259111.pdf","url":"https://fut.repo.nii.ac.jp/record/229/files/KJ00004259111.pdf"},"version_id":"15e0249d-2f5a-42d8-8fc1-cd915ba0b5e7"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"マスクした試料のミスセッティングによるX線応力測定誤差","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"マスクした試料のミスセッティングによるX線応力測定誤差"},{"subitem_title":"Effect of Specimen Mis-setting to X-ray Stress Measurement of Masked Specimen","subitem_title_language":"en"}]},"item_type_id":"10002","owner":"2","path":["1"],"pubdate":{"attribute_name":"公開日","attribute_value":"2009-04-04"},"publish_date":"2009-04-04","publish_status":"0","recid":"229","relation_version_is_last":true,"title":["マスクした試料のミスセッティングによるX線応力測定誤差"],"weko_creator_id":"2","weko_shared_id":-1},"updated":"2023-06-20T14:36:58.627119+00:00"}