{"created":"2023-06-20T13:43:22.335434+00:00","id":1107,"links":{},"metadata":{"_buckets":{"deposit":"703363a6-ac20-4e84-b547-0819b2a6820e"},"_deposit":{"created_by":2,"id":"1107","owners":[2],"pid":{"revision_id":0,"type":"depid","value":"1107"},"status":"published"},"_oai":{"id":"oai:fut.repo.nii.ac.jp:00001107","sets":["1"]},"author_link":["12490","12495","12494","12492","12493","12491"],"item_10002_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2011-08-04","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"41","bibliographicPageEnd":"408","bibliographicPageStart":"403","bibliographic_titles":[{"bibliographic_title":"福井工業大学研究紀要"}]}]},"item_10002_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"In 2011, there are 54 commercial nuclear power plants in Japan. There are 20 nuclear power plants which are working for 30 years or more. It is very important to measure the aged deterioration of the cable used in those nuclear power plants. Generally, degradation of a cable was measured by the tensile test. It was difficult to measure an electrical property quickly and nondestructively. We developed the nondestructive measurement technology of cable degradation which used microwave technology.","subitem_description_type":"Abstract"}]},"item_10002_identifier_registration":{"attribute_name":"ID登録","attribute_value_mlt":[{"subitem_identifier_reg_text":"10.57375/00001101","subitem_identifier_reg_type":"JaLC"}]},"item_10002_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"福井工業大学"}]},"item_10002_relation_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"TF00009560","subitem_relation_type_select":"NCID"}}]},"item_10002_version_type_20":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"砂川, 武義"}],"nameIdentifiers":[{"nameIdentifier":"12490","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"佐伯, 昭紀"}],"nameIdentifiers":[{"nameIdentifier":"12491","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"関, 修平"}],"nameIdentifiers":[{"nameIdentifier":"12492","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Sunagawa, TakeyoshI","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"12493","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Saeki, Akinori","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"12494","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Seki, Shu","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"12495","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2023-04-12"}],"displaytype":"detail","filename":"kiyou4152.pdf","filesize":[{"value":"4.0 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"kiyou4152.pdf","url":"https://fut.repo.nii.ac.jp/record/1107/files/kiyou4152.pdf"},"version_id":"a9b07eee-5af4-4894-9c3a-8a32403a0695"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"マイクロ波検出技術を用いた高分子材料への熱・放射線照射による経年劣化測定技術に関する研究II","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"マイクロ波検出技術を用いた高分子材料への熱・放射線照射による経年劣化測定技術に関する研究II"},{"subitem_title":"Non-contact Quantitative Microwave Detection of Radiation Induced Degradation of Polymers (II)","subitem_title_language":"en"}]},"item_type_id":"10002","owner":"2","path":["1"],"pubdate":{"attribute_name":"公開日","attribute_value":"2011-08-04"},"publish_date":"2011-08-04","publish_status":"0","recid":"1107","relation_version_is_last":true,"title":["マイクロ波検出技術を用いた高分子材料への熱・放射線照射による経年劣化測定技術に関する研究II"],"weko_creator_id":"2","weko_shared_id":-1},"updated":"2023-06-20T14:19:52.791105+00:00"}